Fast-paced technological innovation, greater demands for quality. Less tolerance for waste, and shorter fabrication cycles, driven by more competitive markets, are changing the nature of digital integrated circuit (IC) testing. Here is the first guide to apply modern quality techniques to the practical and applied testing of digital ICs. It helps engineers view testing from a different perspective when trying to develop testing regimens for today's abbreviated test program development time environment.
Digital Integrated Circuit Testing from a Quality Perspective responds to the change from an inspection mentality to a build-it-right-the-first-time mind-set. It explains new testing paradigms and techniques for digital Ics ranging from SSI to high-level VLSI. The author shows how to use quality tools to improve the testing paradigm, make IC testing more efficient, and reduce overall product defects.
Readers will gain a better understanding of the importance of the design and physical layout of devices to be tested, and of how to use that knowledge to devise the closest possible match between products and test methods. Detailed chapters cover every facet of the total quality environment, including costs, specification and variation limits, and measurement and instrumentation issues.
Chapter 1 Introduction
Chapter 2 Integrated Circuit Trends
Chapter 3 Total Quality and the Cost of Quality
Chapter 4 Specification Limits, Variations, and Process Limits
Chapter 5 Measurement and Instrumentation Issues
Chapter 6 Testing Considerations for VLSICs and ASICs
Chapter 7 Testing in a Total Quality Environment
Chapter 8 Afterword: The New Beginning in Test Index